Determination of the electron escape depth for NEXAFS spectroscopy
A novel method was developed to determine carbon atom density as a function of depth by analyzing the postedge signal in near-edge X-ray absorption fine structure (NEXAFS) spectra. We show that the common assumption in the analysis of NEXAFS data from polymer films, namely, that the carbon atom dens...
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Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1991. - 25(2009), 11 vom: 02. Juni, Seite 6341-8
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| Auteur principal: |
Sohn, K E
(Auteur) |
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| Autres auteurs: |
Dimitriou, M D,
Genzer, J,
Fischer, D A,
Hawker, C J,
Kramer, E J |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2009
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
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| Sujets: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S.
Ethers
Polymers |
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