Determination of the electron escape depth for NEXAFS spectroscopy
A novel method was developed to determine carbon atom density as a function of depth by analyzing the postedge signal in near-edge X-ray absorption fine structure (NEXAFS) spectra. We show that the common assumption in the analysis of NEXAFS data from polymer films, namely, that the carbon atom dens...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1991. - 25(2009), 11 vom: 02. Juni, Seite 6341-8
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| 1. Verfasser: |
Sohn, K E
(VerfasserIn) |
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| Weitere Verfasser: |
Dimitriou, M D,
Genzer, J,
Fischer, D A,
Hawker, C J,
Kramer, E J |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2009
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S.
Ethers
Polymers |
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