Style de citation APA

Sohn, K. E., Dimitriou, M. D., Genzer, J., Fischer, D. A., Hawker, C. J., & Kramer, E. J. (2009). Determination of the electron escape depth for NEXAFS spectroscopy. Langmuir : the ACS journal of surfaces and colloids, 25(11), 6341. https://doi.org/10.1021/la803951y

Style de citation Chicago

Sohn, K E., M D. Dimitriou, J. Genzer, D A. Fischer, C J. Hawker, et E J. Kramer. "Determination of the Electron Escape Depth for NEXAFS Spectroscopy." Langmuir : The ACS Journal of Surfaces and Colloids 25, no. 11 (2009): 6341. https://dx.doi.org/10.1021/la803951y.

Style de citation MLA

Sohn, K E., et al. "Determination of the Electron Escape Depth for NEXAFS Spectroscopy." Langmuir : The ACS Journal of Surfaces and Colloids, vol. 25, no. 11, 2009, p. 6341.