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|a pubmed25n0540.xml
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|a (DE-627)NLM161957307
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|a (NLM)16609179
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Oyanagi, H
|e verfasserin
|4 aut
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|a Rapid and sensitive XAFS using a tunable X-ray undulator at BL10XU of SPring-8
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|c 2000
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 16.05.2006
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|a Date Revised 12.04.2006
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a The design and performance of the high-brilliance XAFS facility at BL10XU of SPring-8, aimed at rapid and sensitive measurement of X-ray absorption fine structure (XAFS), is reported. Both undulator gap and double-crystal monochromator have been successfully controlled covering a wide energy range (5-30 keV). A versatile goniometer system, consisting of two independent high-precision goniometers, is capable of polarized XAFS in fluorescence mode and surface-sensitive experiments using a grazing-incidence geometry. By sharing major components, i.e. a monolithic Ge 100-pixel array detector and a closed-cycle He cryostat, both polarized XAFS and X-ray standing wave (XSW) experiments can be performed at low temperature (15-300 K). The performance of the spectrometer has been evaluated by recording XAFS spectra in transmission mode
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|a Journal Article
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|a Ishii, M
|e verfasserin
|4 aut
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|a Lee, C H
|e verfasserin
|4 aut
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|a Saini, N L
|e verfasserin
|4 aut
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|a Kuwahara, Y
|e verfasserin
|4 aut
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|a Saito, A
|e verfasserin
|4 aut
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|a Izumi, Y
|e verfasserin
|4 aut
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|a Hashimoto, H
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 7(2000), Pt 2 vom: 01. März, Seite 89-94
|w (DE-627)NLM09824129X
|x 0909-0495
|7 nnns
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|g volume:7
|g year:2000
|g number:Pt 2
|g day:01
|g month:03
|g pages:89-94
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|a SYSFLAG_A
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|a GBV_ILN_350
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|a GBV_ILN_2005
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|a AR
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|d 7
|j 2000
|e Pt 2
|b 01
|c 03
|h 89-94
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