Rapid and sensitive XAFS using a tunable X-ray undulator at BL10XU of SPring-8
The design and performance of the high-brilliance XAFS facility at BL10XU of SPring-8, aimed at rapid and sensitive measurement of X-ray absorption fine structure (XAFS), is reported. Both undulator gap and double-crystal monochromator have been successfully controlled covering a wide energy range (...
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 7(2000), Pt 2 vom: 01. März, Seite 89-94 |
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Weitere Verfasser: | , , , , , , |
Format: | Aufsatz |
Sprache: | English |
Veröffentlicht: |
2000
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
Schlagworte: | Journal Article |
Zusammenfassung: | The design and performance of the high-brilliance XAFS facility at BL10XU of SPring-8, aimed at rapid and sensitive measurement of X-ray absorption fine structure (XAFS), is reported. Both undulator gap and double-crystal monochromator have been successfully controlled covering a wide energy range (5-30 keV). A versatile goniometer system, consisting of two independent high-precision goniometers, is capable of polarized XAFS in fluorescence mode and surface-sensitive experiments using a grazing-incidence geometry. By sharing major components, i.e. a monolithic Ge 100-pixel array detector and a closed-cycle He cryostat, both polarized XAFS and X-ray standing wave (XSW) experiments can be performed at low temperature (15-300 K). The performance of the spectrometer has been evaluated by recording XAFS spectra in transmission mode |
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Beschreibung: | Date Completed 16.05.2006 Date Revised 12.04.2006 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
ISSN: | 1600-5775 |