Rapid and sensitive XAFS using a tunable X-ray undulator at BL10XU of SPring-8

The design and performance of the high-brilliance XAFS facility at BL10XU of SPring-8, aimed at rapid and sensitive measurement of X-ray absorption fine structure (XAFS), is reported. Both undulator gap and double-crystal monochromator have been successfully controlled covering a wide energy range (...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 7(2000), Pt 2 vom: 01. März, Seite 89-94
1. Verfasser: Oyanagi, H (VerfasserIn)
Weitere Verfasser: Ishii, M, Lee, C H, Saini, N L, Kuwahara, Y, Saito, A, Izumi, Y, Hashimoto, H
Format: Aufsatz
Sprache:English
Veröffentlicht: 2000
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article
Beschreibung
Zusammenfassung:The design and performance of the high-brilliance XAFS facility at BL10XU of SPring-8, aimed at rapid and sensitive measurement of X-ray absorption fine structure (XAFS), is reported. Both undulator gap and double-crystal monochromator have been successfully controlled covering a wide energy range (5-30 keV). A versatile goniometer system, consisting of two independent high-precision goniometers, is capable of polarized XAFS in fluorescence mode and surface-sensitive experiments using a grazing-incidence geometry. By sharing major components, i.e. a monolithic Ge 100-pixel array detector and a closed-cycle He cryostat, both polarized XAFS and X-ray standing wave (XSW) experiments can be performed at low temperature (15-300 K). The performance of the spectrometer has been evaluated by recording XAFS spectra in transmission mode
Beschreibung:Date Completed 16.05.2006
Date Revised 12.04.2006
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775