Local structure study of dilute Er in III-V semiconductors by fluorescence EXAFS

For understanding the luminescence of Er atoms in III-V semiconductors, OMVPE-grown InP doped with Er has been investigated by fluorescence EXAFS (extended X-ray absorption fine structure) in order to study the local structure around Er atoms. The local structures around the Er atoms doped in InP, w...

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Veröffentlicht in:Journal of synchrotron radiation. - 1998. - 5(1998), Pt 3 vom: 01. Mai, Seite 1061-3
1. Verfasser: Ofuchi, H (VerfasserIn)
Weitere Verfasser: Kawamura, D, Tsuchiya, J, Matsubara, N, Tabuchi, M, Fujiwara, Y, Takeda, Y
Format: Aufsatz
Sprache:English
Veröffentlicht: 1998
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article
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245 1 0 |a Local structure study of dilute Er in III-V semiconductors by fluorescence EXAFS 
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520 |a For understanding the luminescence of Er atoms in III-V semiconductors, OMVPE-grown InP doped with Er has been investigated by fluorescence EXAFS (extended X-ray absorption fine structure) in order to study the local structure around Er atoms. The local structures around the Er atoms doped in InP, with doping as dilute as 3 x 10(12) Er atoms in a 1.5 mm x 1.0 mm spot, were successfully measured by fluorescence EXAFS. The EXAFS analysis revealed that the Er atoms doped in InP above 853 K (which showed low luminescence) formed the rock-salt-structure ErP, while the Er atoms doped in InP below 823 K (which showed high luminescence) substituted on the In site of InP. The dependence of the local structure on growth temperature was observed for the samples doped with 3 x 10(12) atoms and 1.2 x 10(13) atoms of Er 
650 4 |a Journal Article 
700 1 |a Kawamura, D  |e verfasserin  |4 aut 
700 1 |a Tsuchiya, J  |e verfasserin  |4 aut 
700 1 |a Matsubara, N  |e verfasserin  |4 aut 
700 1 |a Tabuchi, M  |e verfasserin  |4 aut 
700 1 |a Fujiwara, Y  |e verfasserin  |4 aut 
700 1 |a Takeda, Y  |e verfasserin  |4 aut 
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