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231222s2002 xx ||||| 00| ||eng c |
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|a pubmed25n0392.xml
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|a (DE-627)NLM117578568
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|a (NLM)11872926
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|a DE-627
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|a eng
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|a Korsunsky, Alexander M
|e verfasserin
|4 aut
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|a Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS
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|c 2002
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 31.05.2002
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|a Date Revised 05.06.2019
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0.3 mm(3) sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10(-4). This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source
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|a Journal Article
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|a Collins, Steve P
|e verfasserin
|4 aut
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|a Owen, R Alexander
|e verfasserin
|4 aut
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| 700 |
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|a Daymond, Mark R
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Achtioui, Saïda
|e verfasserin
|4 aut
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| 700 |
1 |
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|a James, Karen E
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 9(2002), Pt 2 vom: 01. März, Seite 77-81
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnas
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| 773 |
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|g volume:9
|g year:2002
|g number:Pt 2
|g day:01
|g month:03
|g pages:77-81
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|a GBV_USEFLAG_A
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|a GBV_ILN_40
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|a GBV_ILN_350
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|a GBV_ILN_2005
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|a AR
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|d 9
|j 2002
|e Pt 2
|b 01
|c 03
|h 77-81
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