Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0...

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Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 9(2002), Pt 2 vom: 01. März, Seite 77-81
1. Verfasser: Korsunsky, Alexander M (VerfasserIn)
Weitere Verfasser: Collins, Steve P, Owen, R Alexander, Daymond, Mark R, Achtioui, Saïda, James, Karen E
Format: Aufsatz
Sprache:English
Veröffentlicht: 2002
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article
Beschreibung
Zusammenfassung:Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0.3 mm(3) sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10(-4). This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source
Beschreibung:Date Completed 31.05.2002
Date Revised 05.06.2019
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775