$Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS$

Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of approximately 30 s per 0...

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 9(2002), Pt 2 vom: 01. März, Seite 77-81
1. Verfasser:	Korsunsky, Alexander M (VerfasserIn)
Weitere Verfasser:	Collins, Steve P, Owen, R Alexander, Daymond, Mark R, Achtioui, Saïda, James, Karen E
Format:	Aufsatz
Sprache:	English
Veröffentlicht:	2002
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article