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231222s2001 xx ||||| 00| ||eng c |
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|a pubmed25n0381.xml
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|a (DE-627)NLM114114129
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|a (NLM)11512717
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|a DE-627
|b ger
|c DE-627
|e rakwb
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| 041 |
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|a eng
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| 100 |
1 |
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|a Lee, J S
|e verfasserin
|4 aut
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|a Linear combination of XANES for quantitative analysis of Ti-Si binary oxides
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|c 2001
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 06.09.2001
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|a Date Revised 05.06.2019
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|a published: Print
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|a Citation Status PubMed-not-MEDLINE
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|a A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most important for the successful application of this method. Three Ti-Si binary oxide systems have been analysed by the new method: Ti-Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents
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|a Journal Article
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1 |
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|a Kim, W B
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Choi, S H
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1999
|g 8(2001), Pt 2 vom: 01. März, Seite 163-7
|w (DE-627)NLM09824129X
|x 0909-0495
|7 nnns
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| 773 |
1 |
8 |
|g volume:8
|g year:2001
|g number:Pt 2
|g day:01
|g month:03
|g pages:163-7
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|a GBV_USEFLAG_A
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|a GBV_ILN_2005
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|a AR
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| 952 |
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|d 8
|j 2001
|e Pt 2
|b 01
|c 03
|h 163-7
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