Linear combination of XANES for quantitative analysis of Ti-Si binary oxides
A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most importan...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1999. - 8(2001), Pt 2 vom: 01. März, Seite 163-7 |
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| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2001
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |
| Zusammenfassung: | A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most important for the successful application of this method. Three Ti-Si binary oxide systems have been analysed by the new method: Ti-Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents |
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| Beschreibung: | Date Completed 06.09.2001 Date Revised 05.06.2019 published: Print Citation Status PubMed-not-MEDLINE |
| ISSN: | 0909-0495 |