The Radon transform as a tool for 3D reciprocal-space mapping of epitaxial microcrystals

par Meduňa, Mojmír
Publié dans: Journal of applied crystallography (2022)

Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures

par Isa, Fabio
Publié dans: Advanced materials (Deerfield Beach, Fla.) (2016)

Unexpected dominance of vertical dislocations in high-misfit ge/si(001) films and their elimination by deep substrate patterning

par Marzegalli, Anna
Publié dans: Advanced materials (Deerfield Beach, Fla.) (2013)