Novel Method for the Rapid Evaluation of the Surface Energies on Film and Window Cover Substrates for Organic Light-Emitting Diode Displays
No existing method can rapidly and quantitatively evaluate the deposition state of antifingerprint nanocoatings over large areas on films and window cover substrates for organic light-emitting diode displays. To address this limitation, we propose a novel method─surface energy mapping and measuremen...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - (2025) vom: 17. Okt. |
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| Format: | Online-Aufsatz |
| Sprache: | English |
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2025
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Zusammenfassung: | No existing method can rapidly and quantitatively evaluate the deposition state of antifingerprint nanocoatings over large areas on films and window cover substrates for organic light-emitting diode displays. To address this limitation, we propose a novel method─surface energy mapping and measurement (SEMM)─for ultrafast SE evaluations. The SEMM method integrates vertical and oblique imaging to simultaneously capture and analyze multiple droplets placed over a large area. This method requires considerably less measurement time than conventional side-view methods. Moreover, for regions with high contact angle (CA) values (>90°), SEMM corrects the apparent droplet height using oblique observations, thereby maintaining measurement accuracy. This paper presents a comprehensive overview of SEMM, including its operating principle, hardware setup, image processing techniques, algorithms for calculating CA and SE, and the validation experiments conducted on various surface samples |
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| Beschreibung: | Date Revised 17.10.2025 published: Print-Electronic Citation Status Publisher |
| ISSN: | 1520-5827 |
| DOI: | 10.1021/acs.langmuir.5c03075 |