Novel Method for the Rapid Evaluation of the Surface Energies on Film and Window Cover Substrates for Organic Light-Emitting Diode Displays

No existing method can rapidly and quantitatively evaluate the deposition state of antifingerprint nanocoatings over large areas on films and window cover substrates for organic light-emitting diode displays. To address this limitation, we propose a novel method─surface energy mapping and measuremen...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1985. - (2025) vom: 17. Okt.
1. Verfasser: Jeong, Do-Young (VerfasserIn)
Weitere Verfasser: Han, Kwan-Young
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2025
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article
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520 |a No existing method can rapidly and quantitatively evaluate the deposition state of antifingerprint nanocoatings over large areas on films and window cover substrates for organic light-emitting diode displays. To address this limitation, we propose a novel method─surface energy mapping and measurement (SEMM)─for ultrafast SE evaluations. The SEMM method integrates vertical and oblique imaging to simultaneously capture and analyze multiple droplets placed over a large area. This method requires considerably less measurement time than conventional side-view methods. Moreover, for regions with high contact angle (CA) values (>90°), SEMM corrects the apparent droplet height using oblique observations, thereby maintaining measurement accuracy. This paper presents a comprehensive overview of SEMM, including its operating principle, hardware setup, image processing techniques, algorithms for calculating CA and SE, and the validation experiments conducted on various surface samples 
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