Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - (2025) vom: 01. Mai
1. Verfasser: Kudo, Togo (VerfasserIn)
Weitere Verfasser: Suzuki, Shinji, Sano, Mutsumi, Itoga, Toshiro, Masunaga, Hiroyasu, Goto, Shunji, Takahashi, Sunao
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2025
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray beam position monitors X-ray beam profile monitors diffraction-limited storage rings front-end slits silicon drift detectors undulators
Beschreibung
Zusammenfassung:open access.
Contamination from nearby bending magnet radiation hinders precise and accurate determination of the true beam center of undulator radiation. To solve this problem, a semi-nondestructive method was developed to visualize the detailed profile of a synchrotron radiation beam by using a thin diamond film as a scatterer. As the beam passed through the diamond film, scattered X-rays were imaged using a pinhole camera and measured with a two-dimensional silicon drift detector (SDD) scan. With this configuration, the beam center was accurately determined by visualizing the radiation pattern distribution for each energy level of a pink X-ray beam within an aperture size of 1.5 mm × 1.5 mm, shaped by a front-end slit (FES) positioned upstream of the monochromator. Additionally, by scanning the FES in two dimensions with a reduced aperture of 0.4 mm × 0.4 mm, energy-resolved images were successfully obtained using the SDD at a fixed position. These images revealed the profile of undulator radiation over a broad area (with an aperture extending up to 4 mm) in a pre-slit positioned upstream of the FES, demonstrating good alignment with SPECTRA calculations. This method effectively eliminates contamination from nearby bending magnet radiation, a significant issue in previous approaches, enabling a direct and highly accurate determination of the true beam center
Beschreibung:Date Revised 22.04.2025
published: Print-Electronic
Citation Status Publisher
ISSN:1600-5775
DOI:10.1107/S1600577525002838