Characterization of Polymer Structure at Buried Interfaces in Films by X-ray Photoelectron Spectroscopy Combined with Gas Cluster Ion Beam
Understanding the aggregation states of polymers at various interfaces, especially buried interfaces, is of pivotal importance not only from an inherent academic interest but also for the design and construction of functional materials and devices. However, precise analysis through laboratory-scale...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 41(2025), 16 vom: 29. Apr., Seite 10668-10675 |
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| Auteur principal: | |
| Autres auteurs: | , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2025
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Journal Article |
| Accès en ligne |
Volltext |