Characterization of Polymer Structure at Buried Interfaces in Films by X-ray Photoelectron Spectroscopy Combined with Gas Cluster Ion Beam

Understanding the aggregation states of polymers at various interfaces, especially buried interfaces, is of pivotal importance not only from an inherent academic interest but also for the design and construction of functional materials and devices. However, precise analysis through laboratory-scale...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1985. - 41(2025), 16 vom: 29. Apr., Seite 10668-10675
1. Verfasser: Saeki, Shintaro (VerfasserIn)
Weitere Verfasser: Taneda, Hidenobu, Abe, Tatsuki, Tanaka, Keiji
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2025
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article
LEADER 01000caa a22002652c 4500
001 NLM38728950X
003 DE-627
005 20250509182009.0
007 cr uuu---uuuuu
008 250508s2025 xx |||||o 00| ||eng c
024 7 |a 10.1021/acs.langmuir.5c00911  |2 doi 
028 5 2 |a pubmed25n1394.xml 
035 |a (DE-627)NLM38728950X 
035 |a (NLM)40254842 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Saeki, Shintaro  |e verfasserin  |4 aut 
245 1 0 |a Characterization of Polymer Structure at Buried Interfaces in Films by X-ray Photoelectron Spectroscopy Combined with Gas Cluster Ion Beam 
264 1 |c 2025 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Revised 03.05.2025 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a Understanding the aggregation states of polymers at various interfaces, especially buried interfaces, is of pivotal importance not only from an inherent academic interest but also for the design and construction of functional materials and devices. However, precise analysis through laboratory-scale experiments remains challenging. In this study, we focused on X-ray photoelectron spectroscopy combined with a gas cluster ion beam (GCIB/XPS). First, the interfacial width of a polymer bilayer along the normal direction was evaluated using this method and compared with values obtained from neutron reflectivity experiments and theoretical calculations. This makes it clear that GCIB/XPS is well-suited for depth profiling of polymer interfaces at the nanometer scale under appropriate conditions. Building on this information, we applied the method to an epoxy resin adhered to a copper substrate, revealing that amine hardener molecules were segregated at the adhered interface. This study highlights that GCIB/XPS, despite being destructive, is a powerful tool for the structural analysis of buried polymer interfaces, and further advancements in this field are highly anticipated 
650 4 |a Journal Article 
700 1 |a Taneda, Hidenobu  |e verfasserin  |4 aut 
700 1 |a Abe, Tatsuki  |e verfasserin  |4 aut 
700 1 |a Tanaka, Keiji  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Langmuir : the ACS journal of surfaces and colloids  |d 1985  |g 41(2025), 16 vom: 29. Apr., Seite 10668-10675  |w (DE-627)NLM098181009  |x 1520-5827  |7 nnas 
773 1 8 |g volume:41  |g year:2025  |g number:16  |g day:29  |g month:04  |g pages:10668-10675 
856 4 0 |u http://dx.doi.org/10.1021/acs.langmuir.5c00911  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_22 
912 |a GBV_ILN_350 
912 |a GBV_ILN_721 
951 |a AR 
952 |d 41  |j 2025  |e 16  |b 29  |c 04  |h 10668-10675