Impact of Sub-Nanoscale Surface Topography on Contact Line Profile : Insights from Coherence Scanning Interferometry
Despite the importance of the effect of subnanoscale roughness on contact line behavior, it is difficult to directly observe the local behavior of contact lines at the micro- and nanoscale, leaving significant gaps in our current understanding. In this research, we investigate contact line motions a...
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Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 41(2025), 1 vom: 14. Jan., Seite 917-925
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| 1. Verfasser: |
Heima, Yuta
(VerfasserIn) |
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| Weitere Verfasser: |
Teshima, Hideaki,
Zhang, Xuehua,
Li, Qin-Yi,
Takahashi, Koji |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2025
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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