Impact of Sub-Nanoscale Surface Topography on Contact Line Profile : Insights from Coherence Scanning Interferometry

Despite the importance of the effect of subnanoscale roughness on contact line behavior, it is difficult to directly observe the local behavior of contact lines at the micro- and nanoscale, leaving significant gaps in our current understanding. In this research, we investigate contact line motions a...

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Publié dans:	Langmuir : the ACS journal of surfaces and colloids. - 1985. - 41(2025), 1 vom: 14. Jan., Seite 917-925
Auteur principal:	Heima, Yuta (Auteur)
Autres auteurs:	Teshima, Hideaki, Zhang, Xuehua, Li, Qin-Yi, Takahashi, Koji
Format:	Article en ligne
Langue:	English
Publié:	2025
Accès à la collection:	Langmuir : the ACS journal of surfaces and colloids
Sujets:	Journal Article