Enhancing Sample Utilization in Noise-Robust Deep Metric Learning With Subgroup-Based Positive-Pair Selection

The existence of noisy labels in real-world data negatively impacts the performance of deep learning models. Although much research effort has been devoted to improving the robustness towards noisy labels in classification tasks, the problem of noisy labels in deep metric learning (DML) remains unde...

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Veröffentlicht in:	IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 33(2024) vom: 22., Seite 6083-6097
1. Verfasser:	Yu, Zhipeng (VerfasserIn)
Weitere Verfasser:	Xu, Qianqian, Jiang, Yangbangyan, Sun, Yingfei, Huang, Qingming
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2024
Zugriff auf das übergeordnete Werk:	IEEE transactions on image processing : a publication of the IEEE Signal Processing Society
Schlagworte:	Journal Article