Enhancing Sample Utilization in Noise-Robust Deep Metric Learning With Subgroup-Based Positive-Pair Selection

par Yu, Zhipeng
Publié dans: IEEE transactions on image processing : a publication of the IEEE Signal Processing Society (2024)

Positive-Unlabeled Learning With Label Distribution Alignment

par Jiang, Yangbangyan
Publié dans: IEEE transactions on pattern analysis and machine intelligence (2023)

MaxMatch Semi-Supervised Learning With Worst-Case Consistency

par Jiang, Yangbangyan
Publié dans: IEEE transactions on pattern analysis and machine intelligence (2023)

Not All Samples are Trustworthy Towards Deep Robust SVP Prediction

par Xu, Qianqian
Publié dans: IEEE transactions on pattern analysis and machine intelligence (2022)