Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices : A comprehensive comparison of analytical techniques

Copyright © 2024 The Author(s). Published by Elsevier Ltd.. All rights reserved.

Bibliographische Detailangaben
Veröffentlicht in:Waste management (New York, N.Y.). - 1999. - 190(2024) vom: 15. Nov., Seite 496-505
1. Verfasser: Lancaster, Shaun T (VerfasserIn)
Weitere Verfasser: Sahlin, Eskil, Oelze, Marcus, Ostermann, Markus, Vogl, Jochen, Laperche, Valérie, Touze, Solène, Ghestem, Jean-Philippe, Dalencourt, Claire, Gendre, Régine, Stammeier, Jessica, Klein, Ole, Pröfrock, Daniel, Košarac, Gala, Jotanovic, Aida, Bergamaschi, Luigi, Di Luzio, Marco, D'Agostino, Giancarlo, Jaćimović, Radojko, Eberhard, Melissa, Feiner, Laura, Trimmel, Simone, Rachetti, Alessandra, Sara-Aho, Timo, Roethke, Anita, Michaliszyn, Lena, Pramann, Axel, Rienitz, Olaf, Irrgeher, Johanna
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2024
Zugriff auf das übergeordnete Werk:Waste management (New York, N.Y.)
Schlagworte:Journal Article Comparative Study Battery LED PCB Recycling WEEE XRF Metals
LEADER 01000caa a22002652 4500
001 NLM379144565
003 DE-627
005 20241124232021.0
007 cr uuu---uuuuu
008 241021s2024 xx |||||o 00| ||eng c
024 7 |a 10.1016/j.wasman.2024.10.015  |2 doi 
028 5 2 |a pubmed24n1611.xml 
035 |a (DE-627)NLM379144565 
035 |a (NLM)39427594 
035 |a (PII)S0956-053X(24)00536-1 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Lancaster, Shaun T  |e verfasserin  |4 aut 
245 1 0 |a Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices  |b A comprehensive comparison of analytical techniques 
264 1 |c 2024 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 23.11.2024 
500 |a Date Revised 23.11.2024 
500 |a published: Print-Electronic 
500 |a Citation Status MEDLINE 
520 |a Copyright © 2024 The Author(s). Published by Elsevier Ltd.. All rights reserved. 
520 |a As the drive towards recycling electronic waste increases, demand for rapid and reliable analytical methodology to analyse the metal content of the waste is increasing, e.g. to assess the value of the waste and to decide the correct recycling routes. Here, we comprehensively assess the suitability of different x-ray fluorescence spectroscopy (XRF)-based techniques as rapid analytical tools for the determination of critical raw materials, such as Al, Ti, Mn, Fe, Co, Ni, Cu, Zn, Nb, Pd and Au, in three electronic waste matrices: printed circuit boards (PCB), light emitting diodes (LED), and lithium (Li)-ion batteries. As validated reference methods and materials to establish metrological traceability are lacking, several laboratories measured test samples of each matrix using XRF as well as other independent complementary techniques (instrumental neutron activation analysis (INAA), inductively coupled plasma mass spectrometry (ICP-MS) and ICP optical emission spectrometry (OES)) as an inter-laboratory comparison (ILC). Results highlighted key aspects of sample preparation, limits of detection, and spectral interferences that affect the reliability of XRF, while additionally highlighting that XRF can provide more reliable data for certain elements compared to digestion-based approaches followed by ICP-MS analysis (e.g. group 4 and 5 metals). A clear distinction was observed in data processing methodologies for wavelength dispersive XRF, highlighting that considering the metals present as elements (rather than oxides) induces overestimations of the mass fractions when compared to other techniques. Eventually, the effect of sample particle size was studied and indicated that smaller particle size (<200 µm) is essential for reliable determinations 
650 4 |a Journal Article 
650 4 |a Comparative Study 
650 4 |a Battery 
650 4 |a LED 
650 4 |a PCB 
650 4 |a Recycling 
650 4 |a WEEE 
650 4 |a XRF 
650 7 |a Metals  |2 NLM 
700 1 |a Sahlin, Eskil  |e verfasserin  |4 aut 
700 1 |a Oelze, Marcus  |e verfasserin  |4 aut 
700 1 |a Ostermann, Markus  |e verfasserin  |4 aut 
700 1 |a Vogl, Jochen  |e verfasserin  |4 aut 
700 1 |a Laperche, Valérie  |e verfasserin  |4 aut 
700 1 |a Touze, Solène  |e verfasserin  |4 aut 
700 1 |a Ghestem, Jean-Philippe  |e verfasserin  |4 aut 
700 1 |a Dalencourt, Claire  |e verfasserin  |4 aut 
700 1 |a Gendre, Régine  |e verfasserin  |4 aut 
700 1 |a Stammeier, Jessica  |e verfasserin  |4 aut 
700 1 |a Klein, Ole  |e verfasserin  |4 aut 
700 1 |a Pröfrock, Daniel  |e verfasserin  |4 aut 
700 1 |a Košarac, Gala  |e verfasserin  |4 aut 
700 1 |a Jotanovic, Aida  |e verfasserin  |4 aut 
700 1 |a Bergamaschi, Luigi  |e verfasserin  |4 aut 
700 1 |a Di Luzio, Marco  |e verfasserin  |4 aut 
700 1 |a D'Agostino, Giancarlo  |e verfasserin  |4 aut 
700 1 |a Jaćimović, Radojko  |e verfasserin  |4 aut 
700 1 |a Eberhard, Melissa  |e verfasserin  |4 aut 
700 1 |a Feiner, Laura  |e verfasserin  |4 aut 
700 1 |a Trimmel, Simone  |e verfasserin  |4 aut 
700 1 |a Rachetti, Alessandra  |e verfasserin  |4 aut 
700 1 |a Sara-Aho, Timo  |e verfasserin  |4 aut 
700 1 |a Roethke, Anita  |e verfasserin  |4 aut 
700 1 |a Michaliszyn, Lena  |e verfasserin  |4 aut 
700 1 |a Pramann, Axel  |e verfasserin  |4 aut 
700 1 |a Rienitz, Olaf  |e verfasserin  |4 aut 
700 1 |a Irrgeher, Johanna  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Waste management (New York, N.Y.)  |d 1999  |g 190(2024) vom: 15. Nov., Seite 496-505  |w (DE-627)NLM098197061  |x 1879-2456  |7 nnns 
773 1 8 |g volume:190  |g year:2024  |g day:15  |g month:11  |g pages:496-505 
856 4 0 |u http://dx.doi.org/10.1016/j.wasman.2024.10.015  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 190  |j 2024  |b 15  |c 11  |h 496-505