Cross-Attention Regression Flow for Defect Detection

Defect detection from images is a crucial and challenging topic of industry scenarios due to the scarcity and unpredictability of anomalous samples. However, existing defect detection methods exhibit low detection performance when it comes to small-size defects. In this work, we propose a Cross-Atte...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 33(2024) vom: 16., Seite 5183-5193
1. Verfasser: Liu, Binhui (VerfasserIn)
Weitere Verfasser: Guo, Tianchu, Luo, Bin, Cui, Zhen, Yang, Jian
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2024
Zugriff auf das übergeordnete Werk:IEEE transactions on image processing : a publication of the IEEE Signal Processing Society
Schlagworte:Journal Article