© 2024 The Author(s). Advanced Materials published by Wiley‐VCH GmbH.
Détails bibliographiques
| Publié dans: | Advanced materials (Deerfield Beach, Fla.). - 1998. - 36(2024), 44 vom: 16. Nov., Seite e2406105
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| Auteur principal: |
Dallaire, Nicholas
(Auteur) |
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| Autres auteurs: |
Boileau, Nicholas T,
Myers, Ian,
Brixi, Samantha,
Ourabi, May,
Raluchukwu, Ewenike,
Cranston, Rosemary,
Lamontagne, Halynne R,
King, Benjamin,
Ronnasi, Bahar,
Melville, Owen A,
Manion, Joseph G,
Lessard, Benoît H |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2024
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| Accès à la collection: | Advanced materials (Deerfield Beach, Fla.)
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| Sujets: | Journal Article
automatic electrical tester (autotester)
high throughput characterization
organic thin film transistors (OTFT)
semiconductor validation
testing and automation |
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