Dallaire, N., Boileau, N. T., Myers, I., Brixi, S., Ourabi, M., Raluchukwu, E., . . . Lessard, B. H. (2024). High Throughput Characterization of Organic Thin Film Transistors. Advanced materials (Deerfield Beach, Fla.), 36(44), . https://doi.org/10.1002/adma.202406105
Style de citation ChicagoDallaire, Nicholas, et al. "High Throughput Characterization of Organic Thin Film Transistors." Advanced Materials (Deerfield Beach, Fla.) 36, no. 44 (2024). https://dx.doi.org/10.1002/adma.202406105.
Style de citation MLADallaire, Nicholas, et al. "High Throughput Characterization of Organic Thin Film Transistors." Advanced Materials (Deerfield Beach, Fla.), vol. 36, no. 44, 2024.
Attention : ces citations peuvent ne pas être correctes à 100%.