Modeling the polarized X-ray scattering from periodic nanostructures with molecular anisotropy

There is a need to characterize nanoscale molecular orientation in soft materials, and polarized scattering is a powerful means to measure this property. However, few approaches have been demonstrated that quantitatively relate orientation to scattering. Here, a modeling framework to relate the mole...

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Publié dans:	Journal of applied crystallography. - 1998. - 50(2017), 6 vom: 23.
Auteur principal:	Liman, Christopher D (Auteur)
Autres auteurs:	Germer, Thomas A, Sunday, Daniel F, DeLongchamp, Dean M, Kline, R Joseph
Format:	Article en ligne
Langue:	English
Publié:	2017
Accès à la collection:	Journal of applied crystallography
Sujets:	Journal Article CDSAXS anisotropic nanostructures critical-dimension small-angle X-ray scattering electromagnetic modelling polarized resonant soft X-ray scattering