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240410s2024 xx |||||o 00| ||eng c |
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|a 10.1107/S1600576724001997
|2 doi
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|a pubmed24n1372.xml
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|a eng
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|a Chèvremont, William
|e verfasserin
|4 aut
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|a A correction procedure for secondary scattering contributions from windows in small-angle X-ray scattering and ultra-small-angle X-ray scattering
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|c 2024
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Revised 11.04.2024
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|a published: Electronic-eCollection
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|a Citation Status PubMed-not-MEDLINE
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|a © William Chèvremont & Narayanan 2024.
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|a This article describes a correction procedure for the removal of indirect background contributions to measured small-angle X-ray scattering patterns. The high scattering power of a sample in the ultra-small-angle region may serve as a secondary source for a window placed in front of the detector. The resulting secondary scattering appears as a sample-dependent background in the measured pattern that cannot be directly subtracted. This is an intricate problem in measurements at ultra-low angles, which can significantly reduce the useful dynamic range of detection. Two different procedures are presented to retrieve the real scattering profile of the sample
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|a Journal Article
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|a SAXS
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|a USAXS
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|a sample-dependent background
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|a secondary scattering
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| 650 |
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|a small-angle X-ray scattering
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| 650 |
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|a ultra-small-angle X-ray scattering
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| 700 |
1 |
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|a Narayanan, Theyencheri
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of applied crystallography
|d 1998
|g 57(2024), Pt 2 vom: 01. Apr., Seite 440-445
|w (DE-627)NLM098121561
|x 0021-8898
|7 nnns
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| 773 |
1 |
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|g volume:57
|g year:2024
|g number:Pt 2
|g day:01
|g month:04
|g pages:440-445
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|u http://dx.doi.org/10.1107/S1600576724001997
|3 Volltext
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|d 57
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|e Pt 2
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|c 04
|h 440-445
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