A correction procedure for secondary scattering contributions from windows in small-angle X-ray scattering and ultra-small-angle X-ray scattering
© William Chèvremont & Narayanan 2024.
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 57(2024), Pt 2 vom: 01. Apr., Seite 440-445 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2024
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article SAXS USAXS sample-dependent background secondary scattering small-angle X-ray scattering ultra-small-angle X-ray scattering |
| Zusammenfassung: | © William Chèvremont & Narayanan 2024. This article describes a correction procedure for the removal of indirect background contributions to measured small-angle X-ray scattering patterns. The high scattering power of a sample in the ultra-small-angle region may serve as a secondary source for a window placed in front of the detector. The resulting secondary scattering appears as a sample-dependent background in the measured pattern that cannot be directly subtracted. This is an intricate problem in measurements at ultra-low angles, which can significantly reduce the useful dynamic range of detection. Two different procedures are presented to retrieve the real scattering profile of the sample |
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| Beschreibung: | Date Revised 11.04.2024 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |
| DOI: | 10.1107/S1600576724001997 |