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|a 10.1107/S1600576723000146
|2 doi
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|a DE-627
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|e rakwb
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|a eng
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|a Nolze, Gert
|e verfasserin
|4 aut
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|a Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections
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|c 2023
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|a Text
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|a ƒaComputermedien
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|a ƒa Online-Ressource
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|a Date Revised 16.09.2024
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|a published: Electronic-eCollection
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|a Citation Status PubMed-not-MEDLINE
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|a © Gert Nolze et al. 2023.
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|a A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Δa/a can reach up to 8% for phases with a high mean atomic number Z, whereas for much more common low-Z materials the offset decreases linearly. A predicted offset Δa/a = f(Z) is therefore proposed, which also includes the unit-cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Z max, i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset-corrected lattice parameter deviation is Δa/a < 1.5%. The lattice parameter ratios, and the angles α, β and γ between the basis vectors, are not affected at all
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|a Journal Article
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|a Funk transform
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|a Kikuchi patterns
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|a automated Bragg angle determination
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|a dynamical theory of electron diffraction
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|a electron backscatter diffraction
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|a lattice parameter determination
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|a lattice parameters
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|a mean atomic number
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|a Tokarski, Tomasz
|e verfasserin
|4 aut
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|a Rychłowski, Łukasz
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of applied crystallography
|d 1998
|g 56(2023), Pt 2 vom: 01. Apr., Seite 361-366
|w (DE-627)NLM098121561
|x 0021-8898
|7 nnns
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|g volume:56
|g year:2023
|g number:Pt 2
|g day:01
|g month:04
|g pages:361-366
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|u http://dx.doi.org/10.1107/S1600576723000146
|3 Volltext
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