Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections
© Gert Nolze et al. 2023.
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 56(2023), Pt 2 vom: 01. Apr., Seite 361-366 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2023
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article Funk transform Kikuchi patterns automated Bragg angle determination dynamical theory of electron diffraction electron backscatter diffraction lattice parameter determination lattice parameters mean atomic number |
| Zusammenfassung: | © Gert Nolze et al. 2023. A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Δa/a can reach up to 8% for phases with a high mean atomic number Z, whereas for much more common low-Z materials the offset decreases linearly. A predicted offset Δa/a = f(Z) is therefore proposed, which also includes the unit-cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Z max, i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset-corrected lattice parameter deviation is Δa/a < 1.5%. The lattice parameter ratios, and the angles α, β and γ between the basis vectors, are not affected at all |
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| Beschreibung: | Date Revised 16.09.2024 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |
| DOI: | 10.1107/S1600576723000146 |