Approaching the Intrinsic Threshold Breakdown Voltage and Ultrahigh Gain in a Graphite/InSe Schottky Photodetector

© 2022 Wiley-VCH GmbH.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 34(2022), 47 vom: 19. Nov., Seite e2206196
1. Verfasser: Zhang, Zhiyi (VerfasserIn)
Weitere Verfasser: Cheng, Bin, Lim, Jeremy, Gao, Anyuan, Lyu, Lingyuan, Cao, Tianjun, Wang, Shuang, Li, Zhu-An, Wu, Qingyun, Ang, Lay Kee, Ang, Yee Sin, Liang, Shi-Jun, Miao, Feng
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article InSe avalanche photodiodes layered materials van der Waals (vdW) Schottky junctions
LEADER 01000naa a22002652 4500
001 NLM346383439
003 DE-627
005 20231226031318.0
007 cr uuu---uuuuu
008 231226s2022 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.202206196  |2 doi 
028 5 2 |a pubmed24n1154.xml 
035 |a (DE-627)NLM346383439 
035 |a (NLM)36121643 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Zhang, Zhiyi  |e verfasserin  |4 aut 
245 1 0 |a Approaching the Intrinsic Threshold Breakdown Voltage and Ultrahigh Gain in a Graphite/InSe Schottky Photodetector 
264 1 |c 2022 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Revised 24.11.2022 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2022 Wiley-VCH GmbH. 
520 |a Realizing both ultralow breakdown voltage and ultrahigh gain is one of the major challenges in the development of high-performance avalanche photodetector. Here, it is reported that an ultrahigh avalanche gain of 3 × 105 can be realized in the graphite/InSe Schottky photodetector at a breakdown voltage down to 5.5 V. Remarkably, the threshold breakdown voltage can be further reduced down to 1.8 V by raising the operating temperature, approaching the theoretical limit of 1.5 E g \[{{\cal E}_{\bf g}}\] /e, with E g ${{\cal E}_{\bf g}}$ the bandgap of semiconductor. A 2D impact ionization model is developed and it is uncovered that observation of high gain at low breakdown voltage arises from reduced dimensionality of electron-phonon scattering in the layered InSe flake. These findings open up a promising avenue for developing novel weak-light detectors with low energy consumption and high sensitivity 
650 4 |a Journal Article 
650 4 |a InSe 
650 4 |a avalanche photodiodes 
650 4 |a layered materials 
650 4 |a van der Waals (vdW) Schottky junctions 
700 1 |a Cheng, Bin  |e verfasserin  |4 aut 
700 1 |a Lim, Jeremy  |e verfasserin  |4 aut 
700 1 |a Gao, Anyuan  |e verfasserin  |4 aut 
700 1 |a Lyu, Lingyuan  |e verfasserin  |4 aut 
700 1 |a Cao, Tianjun  |e verfasserin  |4 aut 
700 1 |a Wang, Shuang  |e verfasserin  |4 aut 
700 1 |a Li, Zhu-An  |e verfasserin  |4 aut 
700 1 |a Wu, Qingyun  |e verfasserin  |4 aut 
700 1 |a Ang, Lay Kee  |e verfasserin  |4 aut 
700 1 |a Ang, Yee Sin  |e verfasserin  |4 aut 
700 1 |a Liang, Shi-Jun  |e verfasserin  |4 aut 
700 1 |a Miao, Feng  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 34(2022), 47 vom: 19. Nov., Seite e2206196  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:34  |g year:2022  |g number:47  |g day:19  |g month:11  |g pages:e2206196 
856 4 0 |u http://dx.doi.org/10.1002/adma.202206196  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 34  |j 2022  |e 47  |b 19  |c 11  |h e2206196