A Van Der Waals Reconfigurable Multi-Valued Logic Device and Circuit Based on Tunable Negative-Differential-Resistance Phenomenon

© 2022 Wiley-VCH GmbH.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 34(2022), 36 vom: 01. Sept., Seite e2202799
1. Verfasser: Seo, Seunghwan (VerfasserIn)
Weitere Verfasser: Cho, Jeong-Ick, Jung, Kil-Su, Andreev, Maksim, Lee, Ju-Hee, Ahn, Hogeun, Jung, Sooyoung, Lee, Taeran, Kim, Byeongchan, Lee, Seojoo, Kang, Juncheol, Lee, Kyeong-Bae, Lee, Ho-Jun, Kim, Ki Seok, Yeom, Geun Young, Heo, Keun, Park, Jin-Hong
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article multi-valued logic computing negative-differential-resistance reconfigurable devices and circuits ternary devices and circuits van der Waals layered materials
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520 |a Multi-valued logic (MVL) technology that utilizes more than two logic states has recently been reconsidered because of the demand for greater power saving in current binary logic systems. Extensive efforts have been invested in developing MVL devices with multiple threshold voltages by adopting negative differential transconductance and resistance. In this study, a reconfigurable, multiple negative-differential-resistance (m-NDR) device with an electric-field-induced tunability of multiple threshold voltages is reported, which comprises a BP/ReS2 heterojunction and a ReS2 /h-BN/metal capacitor. Tunability for the m-NDR phenomenon is achieved via the resistance modulation of the ReS2 layer by electrical pulses applied to the capacitor region. Reconfigurability is verified in terms of the function of an MVL circuit composed of a reconfigurable m-NDR device and a load transistor, wherein staggered-type and broken-type double peak-NDR device operations are adopted for ternary inverter and latch circuits, respectively 
650 4 |a Journal Article 
650 4 |a multi-valued logic computing 
650 4 |a negative-differential-resistance 
650 4 |a reconfigurable devices and circuits 
650 4 |a ternary devices and circuits 
650 4 |a van der Waals layered materials 
700 1 |a Cho, Jeong-Ick  |e verfasserin  |4 aut 
700 1 |a Jung, Kil-Su  |e verfasserin  |4 aut 
700 1 |a Andreev, Maksim  |e verfasserin  |4 aut 
700 1 |a Lee, Ju-Hee  |e verfasserin  |4 aut 
700 1 |a Ahn, Hogeun  |e verfasserin  |4 aut 
700 1 |a Jung, Sooyoung  |e verfasserin  |4 aut 
700 1 |a Lee, Taeran  |e verfasserin  |4 aut 
700 1 |a Kim, Byeongchan  |e verfasserin  |4 aut 
700 1 |a Lee, Seojoo  |e verfasserin  |4 aut 
700 1 |a Kang, Juncheol  |e verfasserin  |4 aut 
700 1 |a Lee, Kyeong-Bae  |e verfasserin  |4 aut 
700 1 |a Lee, Ho-Jun  |e verfasserin  |4 aut 
700 1 |a Kim, Ki Seok  |e verfasserin  |4 aut 
700 1 |a Yeom, Geun Young  |e verfasserin  |4 aut 
700 1 |a Heo, Keun  |e verfasserin  |4 aut 
700 1 |a Park, Jin-Hong  |e verfasserin  |4 aut 
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773 1 8 |g volume:34  |g year:2022  |g number:36  |g day:01  |g month:09  |g pages:e2202799 
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