Sample-Centric Feature Generation for Semi-Supervised Few-Shot Learning
Semi-supervised few-shot learning aims to improve the model generalization ability by means of both limited labeled data and widely-available unlabeled data. Previous works attempt to model the relations between the few-shot labeled data and extra unlabeled data, by performing a label propagation or...
| Veröffentlicht in: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 31(2022) vom: 04., Seite 2309-2320 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2022
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society |
| Schlagworte: | Journal Article |
| Zusammenfassung: | Semi-supervised few-shot learning aims to improve the model generalization ability by means of both limited labeled data and widely-available unlabeled data. Previous works attempt to model the relations between the few-shot labeled data and extra unlabeled data, by performing a label propagation or pseudo-labeling process using an episodic training strategy. However, the feature distribution represented by the pseudo-labeled data itself is coarse-grained, meaning that there might be a large distribution gap between the pseudo-labeled data and the real query data. To this end, we propose a sample-centric feature generation (SFG) approach for semi-supervised few-shot image classification. Specifically, the few-shot labeled samples from different classes are initially trained to predict pseudo-labels for the potential unlabeled samples. Next, a semi-supervised meta-generator is utilized to produce derivative features centering around each pseudo-labeled sample, enriching the intra-class feature diversity. Meanwhile, the sample-centric generation constrains the generated features to be compact and close to the pseudo-labeled sample, ensuring the inter-class feature discriminability. Further, a reliability assessment (RA) metric is developed to weaken the influence of generated outliers on model learning. Extensive experiments validate the effectiveness of the proposed feature generation approach on challenging one- and few-shot image classification benchmarks |
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| Beschreibung: | Date Revised 14.03.2022 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1941-0042 |
| DOI: | 10.1109/TIP.2022.3154938 |