Zhang, B., Ye, H., Yu, G., Wang, B., Wu, Y., Fan, J., & Chen, T. (2022). Sample-Centric Feature Generation for Semi-Supervised Few-Shot Learning. IEEE transactions on image processing : a publication of the IEEE Signal Processing Society, 31, 2309. https://doi.org/10.1109/TIP.2022.3154938
Style de citation ChicagoZhang, Bo, Hancheng Ye, Gang Yu, Bin Wang, Yike Wu, Jiayuan Fan, et Tao Chen. "Sample-Centric Feature Generation for Semi-Supervised Few-Shot Learning." IEEE Transactions on Image Processing : A Publication of the IEEE Signal Processing Society 31 (2022): 2309. https://dx.doi.org/10.1109/TIP.2022.3154938.
Style de citation MLAZhang, Bo, et al. "Sample-Centric Feature Generation for Semi-Supervised Few-Shot Learning." IEEE Transactions on Image Processing : A Publication of the IEEE Signal Processing Society, vol. 31, 2022, p. 2309.