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231225s2005 xx |||||o 00| ||eng c |
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|a 10.1002/adma.200401174
|2 doi
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|a eng
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1 |
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|a Muller, E M
|e verfasserin
|4 aut
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|a Microscopic Evidence for Spatially Inhomogeneous Charge Trapping in Pentacene
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|c 2005
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|a Text
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|a ƒaComputermedien
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|a ƒa Online-Ressource
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|a Date Revised 20.08.2021
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a Copyright © 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a Charge traps in pentacene thin-film transistors (Figure, left) have been imaged using electric force microscopy. The Figure shows a map of the trap distribution just below (middle) and well above (right) the transistor threshold voltage. It is found that the long-lived charge traps in polycrystalline pentacene are distributed inhomogeneously and do not appear to be associated with grain boundaries, as is generally assumed
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|a Journal Article
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|a Charge trapping
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| 650 |
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|a Pentacenes
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| 700 |
1 |
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|a Marohn, J A
|e verfasserin
|4 aut
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|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 17(2005), 11 vom: 06. Juni, Seite 1410-1414
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|g year:2005
|g number:11
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|u http://dx.doi.org/10.1002/adma.200401174
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