Microscopic Evidence for Spatially Inhomogeneous Charge Trapping in Pentacene
Copyright © 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
| Veröffentlicht in: | Advanced materials (Deerfield Beach, Fla.). - 1998. - 17(2005), 11 vom: 06. Juni, Seite 1410-1414 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2005
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| Zugriff auf das übergeordnete Werk: | Advanced materials (Deerfield Beach, Fla.) |
| Schlagworte: | Journal Article Charge trapping Pentacenes |
| Zusammenfassung: | Copyright © 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Charge traps in pentacene thin-film transistors (Figure, left) have been imaged using electric force microscopy. The Figure shows a map of the trap distribution just below (middle) and well above (right) the transistor threshold voltage. It is found that the long-lived charge traps in polycrystalline pentacene are distributed inhomogeneously and do not appear to be associated with grain boundaries, as is generally assumed |
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| Beschreibung: | Date Revised 20.08.2021 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1521-4095 |
| DOI: | 10.1002/adma.200401174 |