The new X-ray absorption fine-structure beamline with sub-second time resolution at the Taiwan Photon Source

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 28(2021), Pt 3 vom: 01. Mai, Seite 930-938
1. Verfasser: Pao, Chih Wen (VerfasserIn)
Weitere Verfasser: Chen, Jeng Lung, Lee, Jyh Fu, Tsai, Meng Che, Huang, Chi Yi, Chiu, Chao Chih, Chang, Chao Yu, Chiang, Liang Chih, Huang, Yu Shan
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2021
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article QXAFS XAFS in situ/operando
Beschreibung
Zusammenfassung:open access.
The new TPS 44A beamline at the Taiwan Photon Source, located at the National Synchrotron Radiation Research Center, is presented. This beamline is equipped with a new quick-scanning monochromator (Q-Mono), which can provide both conventional step-by-step scans (s-scans) and on-the-fly scans (q-scans) for X-ray absorption fine-structure (XAFS) spectroscopy experiments, including X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine-structure (EXAFS) spectral measurements. Ti and Te K-edge XAFS spectra were used to demonstrate the capability of collecting spectra at the limits of the working energy range. The Ni and Cu K-edge XAFS spectra for a Cu-doped Pt/Ni nanocomposite were acquired to test the performance of the newly commissioned beamline. Pt L3- and Ru K-edge quick-scanning XAFS (QXAFS) spectra for standard Pt and Ru foils, respectively, revealed the stability of the q-scan technique. The results also demonstrated the beamline's ability to collect XAFS spectra on a sub-second timescale. Furthermore, a Zn(s)|Zn2+(aq)|Cu(s) system was tested to indicate that the states of the Zn electrode could be observed in real time for charging and discharging conditions using an in situ/operando setup combined with QXAFS measurements
Beschreibung:Date Revised 15.06.2021
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577521001740