A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes
In situ characterization of electrochemical systems can provide deep insights into the structure of electrodes under applied potential. Grazing-incidence X-ray diffraction (GIXRD) is a particularly valuable tool owing to its ability to characterize the near-surface structure of electrodes through a...
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Détails bibliographiques
Publié dans: | Journal of synchrotron radiation. - 1994. - 28(2021), Pt 3 vom: 01. Mai, Seite 919-923
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Auteur principal: |
Landers, Alan T
(Auteur) |
Autres auteurs: |
Koshy, David M,
Lee, Soo Hong,
Drisdell, Walter S,
Davis, Ryan C,
Hahn, Christopher,
Mehta, Apurva,
Jaramillo, Thomas F |
Format: | Article en ligne
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Langue: | English |
Publié: |
2021
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Accès à la collection: | Journal of synchrotron radiation
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Sujets: | Journal Article
electrochemistry
grazing incidence X-ray diffraction
in situ characterization
liquid–solid interfaces
palladium |