A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes

In situ characterization of electrochemical systems can provide deep insights into the structure of electrodes under applied potential. Grazing-incidence X-ray diffraction (GIXRD) is a particularly valuable tool owing to its ability to characterize the near-surface structure of electrodes through a...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 28(2021), Pt 3 vom: 01. Mai, Seite 919-923
Auteur principal: Landers, Alan T (Auteur)
Autres auteurs: Koshy, David M, Lee, Soo Hong, Drisdell, Walter S, Davis, Ryan C, Hahn, Christopher, Mehta, Apurva, Jaramillo, Thomas F
Format: Article en ligne
Langue:English
Publié: 2021
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article electrochemistry grazing incidence X-ray diffraction in situ characterization liquid–solid interfaces palladium