Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies

A bent crystal Laue analyser (BCLA) is an X-ray energy analyser used for fluorescence X-ray absorption fine-structure (XAFS) spectroscopy to separate the fluorescence X-ray emission line of a target atom from the elastic scattering X-rays and other fluorescence emission lines. Here, the feasibility...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 27(2020), Pt 6 vom: 01. Nov., Seite 1618-1625
1. Verfasser: Wakisaka, Yuki (VerfasserIn)
Weitere Verfasser: Hu, Bing, Kido, Daiki, Al Rashid, Md Harun, Chen, Wenhan, Dong, Kaiyue, Wada, Takahiro, Bharate, Bapurao, Yuan, Quiyi, Mukai, Shingo, Takeichi, Yasuo, Takakusagi, Satoru, Asakura, Kiyotaka
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2020
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray absorption fine structure bent crystal Laue analyser in situ surface X-ray absorption fine structure total reflection fluorescence X-ray absorption fine structure