APA Zitierstil

Wakisaka, Y., Hu, B., Kido, D., Al Rashid, M. H., Chen, W., Dong, K., . . . Asakura, K. (2020). Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies. Journal of synchrotron radiation, 27(Pt 6), 1618. https://doi.org/10.1107/S1600577520011170

Chicago Zitierstil

Wakisaka, Yuki, et al. "Bent Crystal Laue Analyser Combined with Total Reflection Fluorescence X-ray Absorption Fine Structure (BCLA + TRF-XAFS) and Its Application to Surface Studies." Journal of Synchrotron Radiation 27, no. Pt 6 (2020): 1618. https://dx.doi.org/10.1107/S1600577520011170.

MLA Zitierstil

Wakisaka, Yuki, et al. "Bent Crystal Laue Analyser Combined with Total Reflection Fluorescence X-ray Absorption Fine Structure (BCLA + TRF-XAFS) and Its Application to Surface Studies." Journal of Synchrotron Radiation, vol. 27, no. Pt 6, 2020, p. 1618.