High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique
Measurements of mass attenuation coefficients and X-ray absorption fine structure (XAFS) of zinc selenide (ZnSe) are reported to accuracies typically better than 0.13%. The high accuracy of the results presented here is due to our successful implementation of the X-ray extended range technique, a re...
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Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 27(2020), Pt 5 vom: 01. Sept., Seite 1262-1277
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| Auteur principal: |
Sier, Daniel
(Auteur) |
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| Autres auteurs: |
Cousland, Geoffrey P,
Trevorah, Ryan M,
Ekanayake, Ruwini S K,
Tran, Chanh Q,
Hester, James R,
Chantler, Christopher T |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2020
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| Accès à la collection: | Journal of synchrotron radiation
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| Sujets: | Journal Article
0.1% accuracy
K-edges
XAFS
XERT
ZnSe |
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