Sier, D., Cousland, G. P., Trevorah, R. M., Ekanayake, R. S. K., Tran, C. Q., Hester, J. R., & Chantler, C. T. (2020). High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique. Journal of synchrotron radiation, 27(Pt 5), 1262. https://doi.org/10.1107/S1600577520010097
Chicago ZitierstilSier, Daniel, Geoffrey P. Cousland, Ryan M. Trevorah, Ruwini S K. Ekanayake, Chanh Q. Tran, James R. Hester, und Christopher T. Chantler. "High Accuracy Determination of Photoelectric Cross Sections, X-ray Absorption Fine Structure and Nanostructure Analysis of Zinc Selenide Using the X-ray Extended Range Technique." Journal of Synchrotron Radiation 27, no. Pt 5 (2020): 1262. https://dx.doi.org/10.1107/S1600577520010097.
MLA ZitierstilSier, Daniel, et al. "High Accuracy Determination of Photoelectric Cross Sections, X-ray Absorption Fine Structure and Nanostructure Analysis of Zinc Selenide Using the X-ray Extended Range Technique." Journal of Synchrotron Radiation, vol. 27, no. Pt 5, 2020, p. 1262.