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231225s2020 xx |||||o 00| ||eng c |
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|a 10.1107/S1600576720006913
|2 doi
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|a pubmed25n1045.xml
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|a (NLM)32788902
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|a DE-627
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|e rakwb
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|a eng
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|a Sala, Simone
|e verfasserin
|4 aut
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|a Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography
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|c 2020
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|a ƒa Online-Ressource
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|a Date Revised 11.11.2023
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|a published: Electronic-eCollection
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|a Citation Status PubMed-not-MEDLINE
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|a © Simone Sala et al. 2020.
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|a The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resolution complex-valued wavefunctions of individual pulses without strong constraints on the illumination or sample object used. The technique is demonstrated within experimental conditions suited for diffraction experiments and exploiting Kirkpatrick-Baez focusing optics. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution
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|a Journal Article
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|a X-ray free-electron lasers
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|a XFELs
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|a ptychography
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|a ultra-short pulses
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|a wavefronts
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|a Daurer, Benedikt J
|e verfasserin
|4 aut
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|a Odstrcil, Michal
|e verfasserin
|4 aut
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|a Capotondi, Flavio
|e verfasserin
|4 aut
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|a Pedersoli, Emanuele
|e verfasserin
|4 aut
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|a Hantke, Max F
|e verfasserin
|4 aut
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|a Manfredda, Michele
|e verfasserin
|4 aut
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|a Loh, N Duane
|e verfasserin
|4 aut
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|a Thibault, Pierre
|e verfasserin
|4 aut
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|a Maia, Filipe R N C
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of applied crystallography
|d 1998
|g 53(2020), Pt 4 vom: 01. Aug., Seite 949-956
|w (DE-627)NLM098121561
|x 0021-8898
|7 nnas
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|g volume:53
|g year:2020
|g number:Pt 4
|g day:01
|g month:08
|g pages:949-956
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|u http://dx.doi.org/10.1107/S1600576720006913
|3 Volltext
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