Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography
© Simone Sala et al. 2020.
| Publié dans: | Journal of applied crystallography. - 1998. - 53(2020), Pt 4 vom: 01. Aug., Seite 949-956 |
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| Auteur principal: | |
| Autres auteurs: | , , , , , , , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2020
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| Accès à la collection: | Journal of applied crystallography |
| Sujets: | Journal Article X-ray free-electron lasers XFELs ptychography ultra-short pulses wavefronts |
| Résumé: | © Simone Sala et al. 2020. The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resolution complex-valued wavefunctions of individual pulses without strong constraints on the illumination or sample object used. The technique is demonstrated within experimental conditions suited for diffraction experiments and exploiting Kirkpatrick-Baez focusing optics. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution |
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| Description: | Date Revised 11.11.2023 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |
| DOI: | 10.1107/S1600576720006913 |