Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography

Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography

© Simone Sala et al. 2020.

Bibliographische Detailangaben
Veröffentlicht in:Journal of applied crystallography. - 1998. - 53(2020), Pt 4 vom: 01. Aug., Seite 949-956
1. Verfasser: Sala, Simone (VerfasserIn)
Weitere Verfasser: Daurer, Benedikt J, Odstrcil, Michal, Capotondi, Flavio, Pedersoli, Emanuele, Hantke, Max F, Manfredda, Michele, Loh, N Duane, Thibault, Pierre, Maia, Filipe R N C
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2020
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article X-ray free-electron lasers XFELs ptychography ultra-short pulses wavefronts
Beschreibung
Zusammenfassung:© Simone Sala et al. 2020.
The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resolution complex-valued wavefunctions of individual pulses without strong constraints on the illumination or sample object used. The technique is demonstrated within experimental conditions suited for diffraction experiments and exploiting Kirkpatrick-Baez focusing optics. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution
Beschreibung:Date Revised 11.11.2023
published: Electronic-eCollection
Citation Status PubMed-not-MEDLINE
ISSN:0021-8898
DOI:10.1107/S1600576720006913