Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals
© Kevin-P. Gradwohl et al. 2020.
| Publié dans: | Journal of applied crystallography. - 1998. - 53(2020), Pt 4 vom: 01. Aug., Seite 880-884 |
|---|---|
| Auteur principal: | |
| Autres auteurs: | , , , , , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2020
|
| Accès à la collection: | Journal of applied crystallography |
| Sujets: | Journal Article X-ray topography diffraction contrast dislocation density dynamical theory high-purity germanium vacancies voids |
| Résumé: | © Kevin-P. Gradwohl et al. 2020. White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection |
|---|---|
| Description: | Date Revised 28.09.2020 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |
| DOI: | 10.1107/S1600576720005993 |