Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

A scanning soft X-ray spectromicroscope was recently developed based mainly on the photon-in/photon-out measurement scheme for the investigation of local electronic structures on the surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere. The appa...

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Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 27(2020), Pt 3 vom: 01. Mai, Seite 664-674
1. Verfasser: Oura, Masaki (VerfasserIn)
Weitere Verfasser: Ishihara, Tomoko, Osawa, Hitoshi, Yamane, Hiroyuki, Hatsui, Takaki, Ishikawa, Tetsuya
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2020
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article helium atmosphere low vacuum photon-in/photon-out scanning spectromicroscope soft X-ray