Oura, M., Ishihara, T., Osawa, H., Yamane, H., Hatsui, T., & Ishikawa, T. (2020). Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere. Journal of synchrotron radiation, 27(Pt 3), 664. https://doi.org/10.1107/S1600577520002258
Style de citation ChicagoOura, Masaki, Tomoko Ishihara, Hitoshi Osawa, Hiroyuki Yamane, Takaki Hatsui, et Tetsuya Ishikawa. "Development of a Scanning Soft X-ray Spectromicroscope to Investigate Local Electronic Structures on Surfaces and Interfaces of Advanced Materials Under Conditions Ranging from Low Vacuum to Helium Atmosphere." Journal of Synchrotron Radiation 27, no. Pt 3 (2020): 664. https://dx.doi.org/10.1107/S1600577520002258.
Style de citation MLAOura, Masaki, et al. "Development of a Scanning Soft X-ray Spectromicroscope to Investigate Local Electronic Structures on Surfaces and Interfaces of Advanced Materials Under Conditions Ranging from Low Vacuum to Helium Atmosphere." Journal of Synchrotron Radiation, vol. 27, no. Pt 3, 2020, p. 664.