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231225s2020 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577520003926
|2 doi
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|a eng
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1 |
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|a Tang, M X
|e verfasserin
|4 aut
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|a Full strain tensor measurements with X-ray diffraction and strain field mapping
|b a simulation study
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|c 2020
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
|b cr
|2 rdacarrier
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|a Date Revised 11.11.2023
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a Strain tensor measurements are important for understanding elastic and plastic deformation, but full bulk strain tensor measurement techniques are still lacking, in particular for dynamic loading. Here, such a methodology is reported, combining imaging-based strain field mapping and simultaneous X-ray diffraction for four typical loading modes: one-dimensional strain/stress compression/tension. Strain field mapping resolves two in-plane principal strains, and X-ray diffraction analysis yields volumetric strain, and thus the out-of-plane principal strain. This methodology is validated against direct molecular dynamics simulations on nanocrystalline tantalum. This methodology can be implemented with simultaneous X-ray diffraction and digital image correlation in synchrotron radiation or free-electron laser experiments
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|a Journal Article
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|a 2D diffraction ring fitting
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|a X-ray diffraction
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|a material strength
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|a strain field
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| 650 |
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|a strain tensor
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| 700 |
1 |
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|a Huang, J W
|e verfasserin
|4 aut
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| 700 |
1 |
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|a E, J C
|e verfasserin
|4 aut
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| 700 |
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|a Zhang, Y Y
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Luo, S N
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 27(2020), Pt 3 vom: 01. Mai, Seite 646-652
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnas
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| 773 |
1 |
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|g volume:27
|g year:2020
|g number:Pt 3
|g day:01
|g month:05
|g pages:646-652
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|u http://dx.doi.org/10.1107/S1600577520003926
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|d 27
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|h 646-652
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