Tang, M. X., Huang, J. W., E, J. C., Zhang, Y. Y., & Luo, S. N. (2020). Full strain tensor measurements with X-ray diffraction and strain field mapping: A simulation study. Journal of synchrotron radiation, 27(Pt 3), 646. https://doi.org/10.1107/S1600577520003926
Style de citation ChicagoTang, M X., J W. Huang, J C. E, Y Y. Zhang, et S N. Luo. "Full Strain Tensor Measurements with X-ray Diffraction and Strain Field Mapping: A Simulation Study." Journal of Synchrotron Radiation 27, no. Pt 3 (2020): 646. https://dx.doi.org/10.1107/S1600577520003926.
Style de citation MLATang, M X., et al. "Full Strain Tensor Measurements with X-ray Diffraction and Strain Field Mapping: A Simulation Study." Journal of Synchrotron Radiation, vol. 27, no. Pt 3, 2020, p. 646.