Contrast Reversal in Scanning Tunneling Microscopy and Its Implications for the Topological Classification of SmB6

© 2020 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 32(2020), 10 vom: 27. März, Seite e1906725
1. Verfasser: Herrmann, Hannes (VerfasserIn)
Weitere Verfasser: Hlawenka, Peter, Siemensmeyer, Konrad, Weschke, Eugen, Sánchez-Barriga, Jaime, Varykhalov, Andrei, Shitsevalova, Natalya Y, Dukhnenko, Anatoliy V, Filipov, Volodymyr B, Gabáni, Slavomir, Flachbart, Karol, Rader, Oliver, Sterrer, Martin, Rienks, Emile D L
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2020
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article heavy fermions photoemission scanning tunneling microscopy topological insulators
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520 |a © 2020 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 
520 |a SmB6 has recently attracted considerable interest as a candidate for the first strongly correlated topological insulator. Such materials promise entirely new properties such as correlation-enhanced bulk bandgaps or a Fermi surface from spin excitations. Whether SmB6 and its surface states are topological or trivial is still heavily disputed however, and a solution is hindered by major disagreement between angle-resolved photoemission (ARPES) and scanning tunneling microscopy (STM) results. Here, a combined ARPES and STM experiment is conducted. It is discovered that the STM contrast strongly depends on the bias voltage and reverses its sign beyond 1 V. It is shown that the understanding of this contrast reversal is the clue to resolving the discrepancy between ARPES and STM results. In particular, the scanning tunneling spectra reflect a low-energy electronic structure at the surface, which supports a trivial origin of the surface states and the surface metallicity of SmB6 
650 4 |a Journal Article 
650 4 |a heavy fermions 
650 4 |a photoemission 
650 4 |a scanning tunneling microscopy 
650 4 |a topological insulators 
700 1 |a Hlawenka, Peter  |e verfasserin  |4 aut 
700 1 |a Siemensmeyer, Konrad  |e verfasserin  |4 aut 
700 1 |a Weschke, Eugen  |e verfasserin  |4 aut 
700 1 |a Sánchez-Barriga, Jaime  |e verfasserin  |4 aut 
700 1 |a Varykhalov, Andrei  |e verfasserin  |4 aut 
700 1 |a Shitsevalova, Natalya Y  |e verfasserin  |4 aut 
700 1 |a Dukhnenko, Anatoliy V  |e verfasserin  |4 aut 
700 1 |a Filipov, Volodymyr B  |e verfasserin  |4 aut 
700 1 |a Gabáni, Slavomir  |e verfasserin  |4 aut 
700 1 |a Flachbart, Karol  |e verfasserin  |4 aut 
700 1 |a Rader, Oliver  |e verfasserin  |4 aut 
700 1 |a Sterrer, Martin  |e verfasserin  |4 aut 
700 1 |a Rienks, Emile D L  |e verfasserin  |4 aut 
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773 1 8 |g volume:32  |g year:2020  |g number:10  |g day:27  |g month:03  |g pages:e1906725 
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